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实验测试 JESD总结介绍.(Thermal Characterization of Packaged)

忘记了。。。。
介绍各个散热参数的,对JESD有点总结的一份文章,看起来比较容易


Introduction
With the continuing industry trends towards smaller, faster, and higher power devices, thermal management is becoming increasingly important. After all, higher device performance can come at a price - higher temperatures and lower reliability - if thermal considerations aren't carefully weighed.
Not only are devices trending smaller but the boards they mount onto are also shrinking. Placing the units closer and closer together on smaller boards helps lower overall system size and cost, and improves electrical performance. These benefits are important; but from a thermal standpoint, raising power while reducing size is a bad combination. It's this increase in "power density" that's been driving the heightened industry focus on thermal management.

The Concept of Thermal Resistance
A common method of characterizing a packaged device's thermal performance is with "Thermal Resistance", denoted by the Greek letter "theta" or θ. For a semiconductor device, thermal resistance indicates the steady state temperature rise of the die junction above a given reference for each watt of power (heat) dissipated at the die surface. Its units are deg C/W.

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大神点评8

6sigmaET 2011-5-1 09:22:16 显示全部楼层

ding,谢了

散热小菜 2011-5-1 09:22:17 显示全部楼层

ding,谢了

 楼主| 龙城 2011-5-1 09:22:17 显示全部楼层


让我如何不顶你。
不顶你我都不爽。

绿丝绦 2011-5-1 09:22:17 显示全部楼层

鹅鹅鹅饿呜呜呜

Haiancheng 2011-5-1 09:22:17 显示全部楼层

嗯,还可以,不错的英文资料。

aoki1978 2014-11-9 12:35:12 显示全部楼层


ding,谢了
magicalfire 2019-6-6 11:26:11 显示全部楼层
非常感谢,努力学习一下
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